| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 1999 | Ellipsometric study of carbon nitride thin films with and without silicon addition | Chen, L. C.; Lin, H. Y.; Wong, C. S.; Chen, K. H.; Lin, S. T.; Yu, Y. C.; Wang, C. W.; Lin, E. K.; Lin, K. C. | DIAMOND AND RELATED MATERIALS 8, 618-622 |
