| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2023 | Steady-State Characterization for Capture and Escape Lifetimes of 2-D Electron Gas in Light-Emitting Transistors | Yang, Lucas; Chang, Shu-Wei ; Wu, Chao-Hsin | IEEE Transactions on Electron Devices 70(7), 3675-3683 |
