| 公開日期 | 題名 | 作者 | 關聯 | scopus | WOS | 全文 |
| 2016 | Near-infrared spectroscopy of nearby Seyfert galaxies: Is there evidence for the shock excitation in narrow-line regions? | Koki Terao; Tohru Nagao; Tetsuya Hashimoto; Kenshi Yanagisawa; Kenta Matsuoka; Yoshiki Toba; Hiroyuki Ikeda; Yoshiaki Taniguchi | ASTROPHYSICAL JOURNAL For Volume 833, Issue 2, article id. 190, 12 pp. | | | |
| 2018 | Physical properties of near-Earth asteroids with a low delta-v: Survey of target candidates for the Hayabusa2 mission | Sunao Hasegawa; Daisuke Kuroda; Kohei Kitazato; Toshihiro Kasuga; Tomohiko Sekiguchi; Naruhisa Takato; Kentaro Aoki; Akira Arai; Young-Jun Choi; Tetsuharu Fuse; Hidekazu Hanayama; Takashi Hattori; Hsiang-Yao Hsiao; Nobunari Kashikawa; Nobuyuki Kawai; Kyoko Kawakami; Daisuke Kinoshita; Steve Larson; Chi-Sheng Lin; Seidai Miyasaka; Naoya Miura; Shogo Nagayama; Yu Nagumo; Setsuko Nishihara; Yohei Ohba; Kouji Ohta; Youichi Ohyama; Shin-ichiro Okumura; Yuki Sarugaku; Yasuhiro Shimizu; Yuhei Takagi; Jun Takahashi; Hiroyuki Toda; Seitaro Urakawa; Fumihiko Usui; Makoto Watanabe; Paul Weissman; Kenshi Yanagisawa; Hongu Yang; Michitoshi Yoshida; Makoto Yoshikawa; Masateru Ishiguro; Masanao Abe | PUBLICATIONS OF THE ASTRONOMICAL SOCIETY OF JAPAN 70(6), 114 | | | |
| 2020 | ULTIMATE-Subaru: conceptual design of WFI, a near-infrared wide field imager | Kentaro Motohara; Yusuke Minowa; Ichi Tanaka; Takashi Hattori; Yusei Koyama; Masahiro Konishi; Kenshi Yanagisawa; Ikuru Iwata; Shiang-Yu Wang ; Richard C. Y. Chou; Masahiko Kimura; John Pazder | SPIE Astronomical Telescopes + Instrumentation, 2020, Proc. SPIE. 11447, 114470N (Online : SPIE) | | | |
| 2020 | ULTIMATE-Subaru: System performance modeling of GLAO and wide-field NIR instruments | Yosuke Minowa; Yusei Koyama; Kenshi Yanagisawa; Kentaro Motohara; Ichi Tanaka; Yoshito Ono; Takashi Hattori; Christophe Clergeon; Yutaka Hayano; Masayuki Akiyama; Tadayuki Kodama; Céline d'Orgeville; Francois Rigaut; Shiang-Yu Wang ; Michitoshi Yoshida | SPIE Astronomical Telescopes + Instrumentation, 2020, Proc. SPIE. 11450, 114500O (Online : SPIE) | | | |
