| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2013 | Characterization of gasochromic Vanadium oxides films by x-ray absorption spectroscopy | Y. K. Ho; C. C. Chang; D. H. Wei; C. L. Dong; C. L. Chen; J. L. Chen; W. L. Jang; C. C. Hsu; T. S. Chan; Krishna Kumar; C. L. Chang; M. K. Wu | Thin Solid Films 544, 461-465 | |||
| 2013 | Effects of oxygen partial pressure on structural and gasochromic properties of sputtered VOx thin films | W. L. Jang; Y. M. Lu; Y. R. Lu; C. L. Chen; C. L. Dong; W. C. Chou; J. L. Chen; T. S. Chan; J.-F. Lee; C.-W. Pao; W. S. Hwang | Thin Solid Films 544, 448-451 | |||
| 2013 | Electronic and atomic structures of gasochromic V2O5 films | C. L. Chen ; C. L. Dong; Y. K. Ho; C. C. Chang ; D. H. Wei; T. C. Chan; J. L. Chen; W. L. Jang; C. C. Hsu; Krishna Kumar; M. K. Wu | Europhysics Letters 101(1), 17006 | |||
| 2013 | Growth and Electronic Properties of Sputtered Ni–NiO Films as a Potential Resistive Memory | W. L. Jang; Y. M. Lu; C. L. Dong; W. S. Hwang; P. H. Hsieh; C. L. Chen; T. S. Chan | Science of Advanced Materials 5, 1-8 | |||
| 2014 | Local geometric and electronic structures of gasochromic VOx films | W. L. Jang; Y. M. Lu; C. L. Chen; Y. R. Lu; C. L. Dong; P. H. Hsieh; W. S. Hwang; J. L. Chen; J. M. Chen; T. S. Chan; J. F. Lee; W. C. Chou | Physical Chemistry Chemical Physics 16, 4699 |
