| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2010 | A TEM investigation of retained defects in Si wafer by 1MeV Si ions bombardment | Hsu, J. Y.; Huang, R. T.; Huang, M. J.; Yu, Y. C. | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS268, 2193-2196 | |||
| 2011 | Temperature effect study of Silicon-on-insulator structures prepared by high dose implantation of nitrogen | Huang, R. T.; Hsu, J. Y.; Huang, J. W.; Yu, Y. C. | Nuclear Instruments and Methods in Phys. Research B269, 3212-3216 |
