| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2011 | Scanning Photoemission Spectromicroscopic study of 4 nm ultrathin SiO3.4 protrusions probe-induced on native SiO2 layer | Devan, R. S.; Gao, S. -Y.; Lin, Y. -R.; Cheng, S. -R.; Hsu, C. -E.; Chen, C. -H.; Shiu, H. -W.; Liou, Y.; Ma, Y. -R. | MICROSCOPY AND MICROANALYSIS17, 944-949 |
