| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
| 2010 | In Situ Eectrical Characterization of the Thickness Dpendence of Organic Field-Efect Transistors with 1-20 Molecular Monolayer of Pentacene | Liu, Shun-Wei; Lee, Chih-Chien; Tai, Hung-Lin; Wen, Je-Min; Lee, Jiun-Haw; Chen, Chin-Ti | ACS Applied Materials & Interfaces 2(8), 2282-2288 | | | |
| 2010 | In situ probing thickness dependence of the field effect mobility of naphthalenetetracarboxylic diimide-based field effect transistors | Liu, Shun-Wei; Lee, Chih-Chien; Tai, Hung-Lin; Wen, Je-Min; Chen, C. -T. | | | | |
| 2011 | In Situ Vacuum Measurement of the Thickness Dependence of Electron Mobility in Naphthalenetetracarboxylic Diimide-Based Field-Effect Transistors | Liu, Shun-Wei; Lee, Chih-Chien; Wen, Je-Min; Chen, Chin-Ti | APPLIED PHYSICS LETTERS 98, 023306 | | | |
