| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2022 | Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis | Lu, Yi-Ying; Yu, Hsiao-Ching; Wang, You-Xin; Hung, Chih-Keng; Chen, You-Ren; Jhou, Jie; Yen, Peter Tsung-Wen; Hsu, Jui-Hung; Sankar, Raman | Nanotechnology 33(48), 485702 |
