http://ir.sinica.edu.tw/handle/201000000A/33334| Title: | Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling | Authors: | Hsu, S. H. Liu, E. S. Chang, Y. C. Hilfiker, J. N. Kim, Y. D. Kim, T. J. Lin, C. J. Lin, G. R. |
Issue Date: | 2008 | Relation: | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 876-9 | URI: | http://ir.sinica.edu.tw/handle/201000000A/33334 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1862-6300&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
| Appears in Collections: | 應用科學研究中心 |
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