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Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/34669
Title: Transparent thin-film characterization by using differential optical sectioning interference microscopy
Authors: Chun-Chieh Wang
Hong-Jhang Jian
Chau-Hwang Lee 
Issue Date: 2007
Conference: Conference on Lasers and Electro-Optics (Baltimore, Maryland, USA : Optical Society of America)
URI: http://ir.sinica.edu.tw/handle/201000000A/34669
Appears in Collections:應用科學研究中心

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