Correlation of Electrical, Thermal and Structural Properties of Microcrystalline Silicon Thin Films

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/44006

Title:	Correlation of Electrical, Thermal and Structural Properties of Microcrystalline Silicon Thin Films
Authors:	Das, Debajyoti Jana, Madhusudan Barua, Ashok K. Chattopadhyay, Surajit Chen, Li Chyong Chen, Kuei Hsien
Issue Date:	2002-03
Relation:	Japanese Journal of Applied Physics 41(3A):L229
URI:	http://ir.sinica.edu.tw/handle/201000000A/44006
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0021-4922&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	http://dx.doi.org/10.1143/jjap.41.l229
Appears in Collections:	原子與分子科學研究所

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