Detection of Styrene Impurities in Phenylacetylene by Resonance-Enhanced Multiphoton Ionization Time-of-Flight Mass Spectrometry

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/44227

題名:	Detection of Styrene Impurities in Phenylacetylene by Resonance-Enhanced Multiphoton Ionization Time-of-Flight Mass Spectrometry
作者:	Tzeng, W. B. Narayanan, K. Lin, J. L.
公開日期:	1999
關聯:	Appl. Spectrosc. 53, 731-734
URI:	http://ir.sinica.edu.tw/handle/201000000A/44227
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-7028&DestApp=JCR&RQ=IF_CAT_BOXPLOT
顯示於：	原子與分子科學研究所

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