Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement.

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/46365

Title:	Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement.
Authors:	Huang, S. Y. Liang, J. J. Hsu, S. Y. Lin, L. K. Tsai, T. C. Lee, S. F.
Issue Date:	2011-01-01
Relation:	EUROPEAN PHYSICAL JOURNAL B79, 153-162
URI:	http://ir.sinica.edu.tw/handle/201000000A/46365
Appears in Collections:	物理研究所

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