http://ir.sinica.edu.tw/handle/201000000A/73554| DC Field | Value | Language |
|---|---|---|
| dc.contributor | 物理研究所 | - |
| dc.contributor.author | Chih-Wen Yang | - |
| dc.contributor.author | Ren-Feng Ding | - |
| dc.contributor.author | Kuang-Yuh Huang | - |
| dc.contributor.author | Ing-Shouh Hwang | - |
| dc.date.accessioned | 2020-12-07T03:02:41Z | - |
| dc.date.available | 2020-12-07T03:02:41Z | - |
| dc.date.issued | 2018-08-20 | - |
| dc.identifier.uri | http://ir.sinica.edu.tw/handle/201000000A/73554 | - |
| dc.description.sponsorship | 物理研究所 | - |
| dc.language.iso | en | - |
| dc.title | High-Sensitivity Imaging with Lateral Resonance Mode Atomic Force Microscopy | - |
| dc.type | conference paper | - |
| dc.relation.conference | The 4th International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials (Leuven, Belgium : Royal Belgian Society for Microscopy (RBSM) The Katholieke Universiteit Leuven (KU Leuven) University of MONS (UMOS)) | - |
| dc.description.note | 已出版;有審查制度;具代表性 | - |
| item.grantfulltext | none | - |
| item.openairetype | conference paper | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
| item.languageiso639-1 | en | - |
| item.cerifentitytype | Publications | - |
| item.fulltext | no fulltext | - |
| Appears in Collections: | 物理研究所 | |
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