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  1. Scholars Hub of the Academia Sinica
  2. 數理科學組
  3. 物理研究所
Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/81013
Title: Multiparametric Characterization of Heterogeneous Soft Materials using Contact Point Detection-Based Atomic Force Microscopy
Authors: Chih-Wen Yang
Ching-Hsiu Chen
Ren-Feng Ding
Hsien-Shun Liao
Ing-Shouh Hwang 
Issue Date: 2020-04-23
Relation: APPLIED SURFACE SCIENCE 522, 146423
URI: http://ir.sinica.edu.tw/handle/201000000A/81013
ISSN: http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0169-4332&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL: https://doi.org/10.1016/j.apsusc.2020.146423
Appears in Collections:物理研究所

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