Optimum Test Planning for Heterogeneous Inverse Gaussian Processes

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/84937

Title:	Optimum Test Planning for Heterogeneous Inverse Gaussian Processes
Authors:	Peng, C. Y. Nagatsuka, H. Cheng, Y. S.
Issue Date:	2022-06
Relation:	Lifetime Data Analysis 28, 401-427
URI:	http://ir.sinica.edu.tw/handle/201000000A/84937
URL:	https://link.springer.com/article/10.1007/s10985-022-09556-6
Appears in Collections:	統計科學研究所

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