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  1. Scholars Hub of the Academia Sinica
  2. 數理科學組
  3. 物理研究所
Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/85403
Title: Evolution of the Electronic Properties of ZrX2 (X = S, Se, or Te) Thin Films under Varying Thickness
Authors: Rovi Angelo B. Villaos
Harvey N. Cruzado
John Symon C. Dizon
Aniceto B. Maghirang III
Zhi-Quan Huang
Chia-Hsiu Hsu
Shin-Ming Huang
Hsin Lin 
Feng-Chuan Chuang
Issue Date: 2021
Relation: The Journal of Physical Chemistry C 125(1), 1134-1142
URI: http://ir.sinica.edu.tw/handle/201000000A/85403
ISSN: http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1932-7447&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL: http://dx.doi.org/10.1021/acs.jpcc.0c10085
Appears in Collections:物理研究所

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