http://ir.sinica.edu.tw/handle/201000000A/90289| DC Field | Value | Language |
|---|---|---|
| dc.contributor | 原子與分子科學研究所 | - |
| dc.contributor.author | Yi-Te Lee | - |
| dc.contributor.author | Yu-Ting Huang | - |
| dc.contributor.author | Shao-Pin Chiu | - |
| dc.contributor.author | Ruey-Tay Wang | - |
| dc.contributor.author | Takashi Taniguchi | - |
| dc.contributor.author | Kenji Watanabe | - |
| dc.contributor.author | Raman Sankar | - |
| dc.contributor.author | Chi-Te Liang | - |
| dc.contributor.author | Wei-Hua Wang | - |
| dc.contributor.author | Sheng-Shiuan Yeh | - |
| dc.contributor.author | Juhn-Jong Lin | - |
| dc.date.accessioned | 2025-01-09T07:09:24Z | - |
| dc.date.available | 2025-01-09T07:09:24Z | - |
| dc.date.issued | 2023-12-19 | - |
| dc.identifier.uri | http://ir.sinica.edu.tw/handle/201000000A/90289 | - |
| dc.description.sponsorship | 原子與分子科學研究所 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | ACS APPLIED MATERIALS & INTERFACES 16(1), 1066-1073 | - |
| dc.title | Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors | - |
| dc.type | journal article | - |
| dc.identifier.url | https://pubs.acs.org/doi/full/10.1021/acsami.3c14312 | - |
| dc.description.note | 已出版;[SCI];有審查制度;具代表性 | - |
| item.grantfulltext | none | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.languageiso639-1 | en | - |
| item.cerifentitytype | Publications | - |
| item.fulltext | no fulltext | - |
| crisitem.author.dept | Institute of Atomic and Molecular Sciences | - |
| crisitem.author.parentorg | Division of Mathematics and Physical Sciences | - |
| Appears in Collections: | 原子與分子科學研究所 | |
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