| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2008 | Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling | Hsu, S. H.; Liu, E. S.; Chang, Y. C.; Hilfiker, J. N.; Kim, Y. D.; Kim, T. J.; Lin, C. J.; Lin, G. R. | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 876-9 |
