Variation of Electronic Structures of CeAl2 Thin Films with Thickness Studied by X-ray absorption near edge structure spectroscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/46691

Title:	Variation of Electronic Structures of CeAl2 Thin Films with Thickness Studied by X-ray absorption near edge structure spectroscopy
Authors:	Dong, Chung-Li
Issue Date:	2006
Relation:	J. Electron Spectrosc. Relat. Phenom152, 1-2
URI:	http://ir.sinica.edu.tw/handle/201000000A/46691
Appears in Collections:	物理研究所

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