http://ir.sinica.edu.tw/handle/201000000A/46976| Title: | Full-field hard x-ray microscopy below 30 nm: a challenging nanofabrication achievement | Authors: | Hwu, Yeu-Kuang | Issue Date: | 2008-08-01 | Relation: | NANOTECHNOLOGY39(19),395302 | URI: | http://ir.sinica.edu.tw/handle/201000000A/46976 |
| Appears in Collections: | 物理研究所 |
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