http://ir.sinica.edu.tw/handle/201000000A/48533
Title: | Effect of Focused Ion Beam Deposition Induced Contamination on the Transport Properties of Nano Devices | Authors: | Yann-Wen Lan Wen-Hao Chang Yuan-Chih Chang Chia-Seng Chang Chii-Dong Chen |
Issue Date: | 2015-01 | Relation: | NANOTECHNOLOGY 26, 055705 | URI: | http://ir.sinica.edu.tw/handle/201000000A/48533 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
Appears in Collections: | 物理研究所 |
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