Effect of Focused Ion Beam Deposition Induced Contamination on the Transport Properties of Nano Devices

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/48533

題名:	Effect of Focused Ion Beam Deposition Induced Contamination on the Transport Properties of Nano Devices
作者:	Yann-Wen Lan Wen-Hao Chang Yuan-Chih Chang Chia-Seng Chang Chii-Dong Chen
公開日期:	2015-01
關聯:	NANOTECHNOLOGY 26, 055705
URI:	http://ir.sinica.edu.tw/handle/201000000A/48533
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT
顯示於：	物理研究所

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