Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/53388

題名:	Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope
作者:	Lin, Huiting Wu, Sing-Lin Wang, Ji-Wun Chen, Tse-Jun Wang, Ming-Jye Chen, Jeng-Chung Wu, Maw-Kuen Chi, Cheng-Chung
公開日期:	2015-07
關聯:	SUPERCONDUCTOR SCIENCE & TECHNOLOGY 28(8), 085006
URI:	http://ir.sinica.edu.tw/handle/201000000A/53388
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0953-2048&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	http://dx.doi.org/10.1088/0953-2048/28/8/085006
顯示於：	天文及天文物理研究所

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