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Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/90289
Title: Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors
Authors: Yi-Te Lee
Yu-Ting Huang
Shao-Pin Chiu
Ruey-Tay Wang
Takashi Taniguchi
Kenji Watanabe
Raman Sankar
Chi-Te Liang
Wei-Hua Wang 
Sheng-Shiuan Yeh
Juhn-Jong Lin
Issue Date: 2023-12-19
Relation: ACS APPLIED MATERIALS & INTERFACES 16(1), 1066-1073
URI: http://ir.sinica.edu.tw/handle/201000000A/90289
URL: https://pubs.acs.org/doi/full/10.1021/acsami.3c14312
Appears in Collections:原子與分子科學研究所

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