| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2023 | Astigmatic Detection System with Feedback Mechanism for Calibrating Driving Waveform of Piezoelectric Actuators | Hsien-Shun Liao; Zheng-Rong Guo; Hong-Sheng Tan; Kuang-Yuh Huang; Ing-Shouh Hwang ; En-Te Hwu | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 72, 1007907 | |||
| 2014 | High-Sensitivity Imaging in Liquid by Torsional Resonance Mode Atomic Force Microscopy utilizing Lorentz Force Actuation | Ren-Feng Ding; Shih-Hsiu Lai; Hsien-Shun Liao; Wei-Chiao Lai; Kuang-Yuh Huang; Chia-Seng Chang; Ing-Shouh Hwang; Chih-Wen Yang | ||||
| 2014 | High-Speed and Large-Range Scanner Integrated with Astigmatic Detection System for Atomic Force Microscope | Ren-Feng Ding; Hsuan-Fu Huang; Biing-Chwen Chang; Hsien-Shun Liao; Chih- Wen Yang; En-Te Hwu; Kuang-Yuh Huang; Chia-Seng Chang; Ing-Shouh Hwang | ||||
| 2018 | Imaging initial formation processes of nanobubbles at the graphite–water interface through high-speed atomic force microscopy | Hsien-Shun Liao; ∗; Chih-Wen Yang; Hsien-Chen Ko; En-Te Hwu; Ing-Shouh Hwang | Applied Surface Science 434, 913-917 | |||
| 2013 | Imaging soft matters in water with torsional mode atomic force microscopy | Chih-Wen Yang; Ping-Hsiang Su; En-Te Hwu; Hsien-Shun Liao; Ing-Shouh Hwang | ULTRAMICROSCOPY 135, 121–125 | |||
| 2020 | Multiparametric Characterization of Heterogeneous Soft Materials using Contact Point Detection-Based Atomic Force Microscopy | Chih-Wen Yang; Ching-Hsiu Chen; Ren-Feng Ding; Hsien-Shun Liao; Ing-Shouh Hwang | APPLIED SURFACE SCIENCE 522, 146423 | |||
| 2014 | Torsional Resonance Mode Atomic Force Microscopy in Liquid Using Photothermal Actuation | Ren-Feng Ding; Hsien-Shun Liao; Ya-Ling Chiang; Kuang-Yuh Huang; Chia-Seng Chang; Ing-Shouh Hwang; Chih-Wen Yang | ||||
| 2013 | Torsional Resonance Mode Atomic Force Microscopy in Liquid with Lorentz Force Actuation | Ren-Feng Ding; Shih-Hsiu Lai; Hsien-Shun Liao; Wei-Chiao Lai; Kuang-Yuh Huang; Chia-Seng Chang; Ing-Shouh Hwang; Chih-Wen Yang | NANOTECHNOLOGY 24, 305702 | |||
| 2012 | Torsional Resonance Mode Atomic Force Microscopy in Liquid with Lorentz Force Actuation | Ren-Feng Ding; Hsien-Shun Liao; Wei-Chiao Lai; Shih-Hsiu Lai; Chia-Seng Chang; Ing-Shouh Hwang; Chih-Wen Yang |
